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The most critical measurement parameters of UPW in microelectronics are total organic carbon, resistivity, silica, dissolved oxygen, and dissolved ozone. Safeguarding water quality necessitates the use of high-performance on-line sensors and analyzers, which METTLER TOLEDO offers.
In the guide "5 Critical Measurements for UPW in Microelectronics", you will find different articles on the importance of measuring the purity of water in the microelectronics industry.
Since 1964, METTLER TOLEDO Thornton has been at the forefront of water purity in the semiconductor industry, and is recognized globally as the leader in UPW measurements. Monitoring UPW protects the final product from contaminants, ensuring higher yield, faster cycle times, and improved economics of operation. METTLER TOLEDO instruments for resistivity/conductivity, TOC, microbial contamination, pH, ORP, DO, silica, sodium, and O3 are specified in microelectronics manufacturing facilities worldwide to monitor and control critical UPW systems. In ""5 Critical Measurements for UPW in Microelectronics you will find articles on the various measurement parameters:
- Total Organic Carbon, Continuous & On-Line
- Resistivity, Analyzer for Rigorous Requirements
- Dissolved Oxygen, Fast Response, Trace Monitoring
- Dissolved Ozone, Confirm System Sanitization
METTLER TOLEDO's portfolio of sensors includes among others the following:
- In-line dissolved oxygen sensors for the monitoring of oxygen levels.
- TOC analyzers for fast and continuous measurement.
- Resistivity sensors with the highest accuracy and lowest maintenance.
- Silica analyzers for pure water control.
- Dissolved ozone sensors for rapid ozone measurement.
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