Lapping and chemical-mechanical polishing (CMP) are essential steps to create a uniformly flat wafer surface. After CMP, the wafer achieves a mirror-like finish.
To get the perfect mechanical properties in the slurry used for polishing, companies can use non-contact weighing and metering equipment to do the proportioning. Accurate weighing of the individual components of the polishing slurry is critical to avoid damaging wafers and wafer processing equipment. METTLER TOLEDO’s high-precision weighing platforms allow weighing up to 300 kg, with a resolution of up to 750,000d. The machines' easy internal adjustment ensures consistent batch quality. For tank weighing applications up to 5000 kg, PowerMount™ weigh modules with an IND360 compact automation indicator are ideal. They offer the high accuracy, reliability, and real-time condition monitoring typically required for these processes.
These solutions can also be easily integrated into your system, reducing downtime and simplifying your job during the integration process.
During the polishing process, it is essential to monitor the percent of dispersed solids in the slurry blend at various stages to ensure the optimum degree of polishing. A moisture analyzer can easily achieve this at high speed.
Monitoring the pH and conductivity levels of CMP slurry is crucial to maintaining a stable colloidal slurry and ensuring the quality and consistency of the wafer's surface. Any slight change in the pH impacts the slurry's chemical reactivity and material removal rate, while conductivity helps monitor electrical interactions between the wafer and slurry. To address this challenge, METTLER TOLEDO offers several inline and offline pH and conductivity sensors.